Power MOSFET DIODE TRANSISTOR Semiconductor Testers - New and Reconditioned
Small Signal and Power Discrete Semiconductor Tester
Breakdown Voltages, Leakage Currents, Saturation, On-State, Off-State, Gain, HFE, DC, AC Test Parameters
Test, Measure, Analyze, Characterize, Sort, Classify, Screen, Grade Devices
Small Signal and Power Semiconductor Testing
Transistors, Diodes, FETs, Jfets, Zeners, IGBTs, Mosfets, Power Fets, Rectifiers, Bridges, Relays, SCRs, Triacs, Opto-Coupled Devices, Hybrids, Arrays
High Accuracy Parametric Testing of Leakage Current, Breakdown Voltage, Gain, AC, On-State Tests, Off-State Tests, Saturation Voltage, Impedance, Transconductance, Capacitance, and More
Lorlin 7BT Discrete Tester Datasheet
Lorlin Tester Brochure
This Months Special Deal:
Reconditioned Lorlin® Impact 7BT for Sale
Lorlin Reconditioned Impact 7BT Tester for Sale
- PC Included wih Windows 10 Testing Software
- Lorlin® Application Test Solutions
- Powerful Software Tools
- Debug Allows Test and Changes by Parameter
- Accept, Retest, Reject Test Data and Maintain SN
- Columnar Printout Format by Test Parameter
- Statistical Analysis of Data
- Hi-Rel Pre/Post Comparisions
- Data Conversion to Excel
- Software Licenses
- 600 Volts, 20 Amps Standard
- Expands up to 2KV and 400 Amps
- Front Panel Manual Test Station
- Lorlin Certified Factory Reconditioned
- Extended Check-Out and Burn-In
- Calibrated with Certificate
- One Year Warranty Standard
- SN 4224
Reconditioned Options Available:
- Higher Voltage
- Higher Current
- Power FET
- AC 1Khz Testing Option
- Test Fixtures and Kits
- Performance Test Fixture
- Spare Boards and Parts Kits
- Matrix/Scanner Test Station, 100 Pin
- Additional Test Stations
- Extended Warranty
- Service Programs
- Test Program Services
sales@lorlin.com
631-392-1385 Voice 631-940-8455 Fax
Reconditioned Lorlin Impact 7BT shown above with a Windows 10 Laptop
The Lorlin™ Impact 7BT Test System
The 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results and uses a Windows 10 64-BIT Operating Systems and a USB 2.0 Interface..
Customers can test components in bulk or large quantities of unknown part numbers and sort them by the highest valued or desired parts of the day by using our special sorting classifying and priority order part number software yielding the most profitable results for distributors and manufacturers
7BT DATASHEET
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Features
- 600 to 2000 Volts Standard
- Higher Voltages Available
- 20 to 500 Amps Standard
- Higher Currents Available
- 3 Station Capability
- Handler & Prober Interfaces
- PC Applications Software
- Fast, Accurate, Repeatable
- Hybrid, Array Station
- New 2KV, 200A Version
- Custom Test Fixture Service
- Extensive Test Parameter Library
- Device Test Programming Services Available
- Windows 10 64-BIT OS with USB 2.0
- Free Technical Support
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A variety of test stations can accommodate almost any application including incoming inspection, final test, wafer probe, quality control, and component characterization. The tester is controlled by a PC operating under Windows 10 64-BIT with Lorlin's Windows PC Application Software 7+.
Over 50 years of engineering excellence, innovation, creativity and advanced technology is what made Lorlin testers so popular in the industry. Proven out test designs, repeatability, stability, accuracy are among the many reasons so many test engineers specify Lorlin.
The Impact 7BT tester is a result of the years of dedication to research and development. There is no other tester more reliable and is the industry workhorse. Both new and factory reconditioned units are available with the same warranty, specifications and licensed software. The Impact systems have tested billions of parts throughout the world and remain the number one source for testing small signal and power semiconductor components.
Lorlin Test Systems® manufactures and distributes semiconductor component test systems. Through years of dedicated engineering excellence, proven designs, and achievements, Lorlin is proud to maintain the leading cutting edge technology offered in our products. Lorlin's dynamic and encompassing solutions are tailored to customers specific needs and requirements for virtually any test application.
Proven superior and advanced analog and digital electronics engineering designs for over 50 years utilizing advanced circuitry and technology is why Lorlin products are so desired by engineers. Our visions of the research and development needed to meet the demands of today were realized years ago.
Smooth, flawless and flowing engineering design excellence have yielded success, complete customer satisfaction and overwhelming confidence in Lorlins equipment performance. Our test concepts have been developed in an environment of creative flux and intuition with achievements unsurpassed.
Our flexibility and creativity enable us to fulfill your application desires and targeted test and manufacturing goals while staying within your budget. The parametric testing equipment is used to test, evaluate and analyze the electrical characteristics of semiconductor devices in component testing and semiconductor manufacturing applications such as production and final test, wafer probe and wafer mapping, QC & QA test, incoming inspection, engineering evaluation and characterization, high reliability, and high volume testing.
