Lorlin Test Systems©
Discrete Semiconductor Component Test Systems 50 Years of Business - Over 3000 Customers
The Lorlin™ product line is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test systems can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results. Customers can test components in bulk or large quantities of unknown part numbers and sort them by the highest valued or desired parts of the day by using our unique sorting classifying and priority order part number software yielding the most profitable results for distributors and manufacturers. Counterfeit Device Detection
Lorlin XP-8500 Test System
Lorlin manufacturers New and Rebuilt Discrete Component Semiconductor Test Systems for Transistors, Diodes, Zeners, Fets, IGBTs, SCRs, Triacs, Optos, Small Signal and Power Semiconductors. We measure, screen, test, analyze, characterize and sort the critical parameters of semiconductors devices including Leakage Current, Breakdown Voltage, Gain, Saturation Voltages, and offer a comprehensive test parameter library with an easy to use Windows based applications software. Our device library covers 1000's of the most common devices and can easily be edited for similar parts. Engineering excellence, innovation, creativity and cutting edge technology has made Lorlin equipment well known for testing discrete components. |

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Lorlin offers the most affordable small signal and power semiconductor test solutions on the market with capabilities that excel above and beyond any competitor. Speed, Accuracy, Repeatability, Functionality. Lorlin gives you the best price and superior performance.
Lorlin Small Signal and Power Semiconductor Discrete Tester Systems
XP-8500 Impact 7BT Double Impact Rebuilt Testers
Lorlin offers power semiconductor testers for up to 2000 Volts and 500 Amps
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Double Impact Tester PDF Brochure
Low Leakage Measurement Information PDF
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Lorlin's product line of high performance semiconductor component testing equipment provides the best quality at affordable prices. Lorlin semiconductor device testers are used in all component test applications including incoming inspection, quality control, engineering, wafer probe, and production final test. Lorlin has supplied semiconductor test equipment for over 40 years. A historic test system leader with Reliable, Accurate, and Repeatable results.
System Rental Programs
Rent a Lorlin tester at a low monthly price
100% Direct Lorlin Financing with 0% Interest
Rent to Own Option with 50 % of Payments Applied to the Purchase Price
1-2 Year Rental Agreements, Renewable Annually Thereafter
Configurations from 600 to 2000 Volts, 20 to 500 Amps and One to Five Test Stations
Manual or Automatic Handler/Prober Applications
Small Signal and Power Semiconductor Testing Applications
Systems include Warranty, Latest Lorlin PC Software, and Customer Support
This Rental Program applies to Rebuilt Lorlin 7BT and Double Impact Systems
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Lorlin Test Systems
Tel: 508-879-1827
sales@lorlin.com

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Lorlin Test Systems has been selling testers since 1964 and highly regarded as the
world experts in the science and specialized technology of advanced testing,
measurement, analysis and characterization of discrete semiconductor component devices.
Our technology and capabilities are advanced as a result of years of
engineering excellence, innovation, and creativity.
Get Credit and Trade In Your Fettest 3400, 3600, 9400, 9600 or Tesec 881 and other Tesec models
Other Used Testers Now Available that were Taken In on Trade: Fettest 3400, Scientific Test 5000, Tesec
..Copyright© Lorlin Test Systems 2013
All products and the Lorlin Test Systems© name are trademarked™ and copyrighted©.