Lorlin Test Systems©

Discrete Semiconductor Component Test Systems

50 Years of Business - Over 3000 Customers


Test, Sort, Screen, Grade, Classify, Evaluate, Measure, Analyze, Characterize Small Signal and Power Semiconductors

The Lorlin™  product line  is designed to test small signal and power semiconductor components in both single and  multi-device packages or hybrids..   The automatic test systems can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability.  The system tests most all discrete semiconductors with  reliable, accurate, and repeatable results.   

Customers can test components in bulk or large quantities of unknown part numbers and sort them by the highest valued or desired parts of the day by using our unique sorting classifying and priority order part number software yielding the most profitable results for distributors and manufacturers.

Counterfeit Device Detection

 

 

 

 

Lorlin XP-8500 Test System

  • 2000 Volts

  • 200 Amps

  • 3 Station Capability

  • Handler & Prober Interfaces

  • Windows XP© PC Applications Software

  • Fast and Accurate

  • Hybrid, Array Station Options

  • Higher Current Options Available

XP-8500 Information

Lorlin manufacturers New and Rebuilt Discrete Component Semiconductor Test Systems for Transistors, Diodes, Zeners, Fets, IGBTs, SCRs, Triacs, Optos, Small Signal and Power Semiconductors.   We measure, screen, test,  analyze, characterize and sort the critical parameters of semiconductors devices including Leakage Current, Breakdown Voltage, Gain, Saturation Voltages, and offer a comprehensive test parameter library with an easy to use Windows based applications software.   Our device library covers 1000's of the most common devices and can easily be edited for similar parts. Engineering excellence, innovation, creativity and cutting edge technology has made Lorlin equipment well known for testing discrete components.    

               

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Lorlin offers the most affordable small signal and power semiconductor test solutions on the market with capabilities that excel above and beyond any competitor.  Speed, Accuracy, Repeatability, Functionality.  Lorlin gives you the best price and superior performance.

Lorlin Small Signal and Power Semiconductor Discrete Tester Systems

                                    

         XP-8500                  Impact 7BT                    Double Impact                    Rebuilt Testers

Lorlin offers power semiconductor testers for up to 2000 Volts  and 500 Amps

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7BT Tester PDF Brochure     

Double Impact Tester PDF Brochure

Low Leakage Measurement Information PDF

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Lorlin's product line of high performance semiconductor component testing equipment provides the best quality at affordable prices.  Lorlin semiconductor device testers are used in all component test applications including incoming inspection, quality control, engineering, wafer probe, and production final test.  Lorlin has supplied semiconductor test equipment for over 40 years.   A historic test system leader with Reliable, Accurate, and Repeatable results.

System Rental Programs

 

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Lorlin Test Systems        Tel: 508-879-1827           sales@lorlin.com

       


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Lorlin Test Systems has been selling testers since 1964 and highly regarded as the  world experts  in the science and specialized technology of advanced testing, measurement, analysis and characterization of discrete semiconductor component devices.  Our  technology and capabilities are advanced as a result of years of engineering excellence, innovation,  and creativity.

      

Customer List              About Lorlin

Get Credit and Trade In Your Fettest 3400, 3600, 9400, 9600 or Tesec 881 and other Tesec models

Other Used Testers Now Available that were Taken In on Trade: Fettest 3400, Scientific Test  5000, Tesec

..Copyright© Lorlin Test Systems 2013

All products and the Lorlin Test Systems© name are trademarked™ and copyrighted©.