Lorlin Test Systems

Discrete Semiconductor Component Test Systems

50 Years of Business - Over 3000 Customers

Test, Sort, Screen, Grade, Classify, Evaluate, Measure, Analyze, Characterize Small Signal and Power Semiconductors

The Lorlin Test System™  product line  is designed to test small signal and power semiconductor components in both single and  multi-device packages or hybrids..   The automatic device test systems can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability.  Lorlin systems tests most all discrete semiconductors with  reliable, accurate, and repeatable results.   

Customers can test components in bulk or large quantities of unknown part numbers and sort them by the highest valued or desired parts of the day by using our unique sorting classifying and priority order part number software yielding the most profitable results for distributors and manufacturers.

Counterfeit Device Detection

 

24/7 World-Wide Sales and Support

 

Lorlin Test Systems       Tel: 508-879-1827           sales@lorlin.com

 

Register for Free Technical Support

 

 

 

Lorlin XP-8500 Test System

  • 2000 Volts

  • Higher Voltage Options Available

  • 200 Amps

  • Higher Current Options Available

  • 3 Station Capability Standard

  • Expandable to 5 Test Stations per System

  • Manual & Automatic Operator Test Stations

  • Handler & Prober Test Station Interfaces

  • Customized Engineered Fixturing Solutions

  • Extensive Device Test Parameter Library

  • Custom Component Test Programming Services

  • Windows XP© Lorlin ™ PC Applications Software©

  • Fast and Accurate

  • Hybrid, Array and Scanner Test Station Options

  • The Most Powerful Software in the Industry

  • Leakage Current Measurements in the Pico Amp and Femto Amp Regions

  • Overall System Accuracy 0.01%

XP-8500 Information

Lorlin manufacturers New and Rebuilt Discrete Component Semiconductor Test Systems for Transistors, Diodes, Zeners, Fets, IGBTs, SCRs, Triacs, Optos, Small Signal and Power Semiconductors.   We measure, screen, test,  analyze, characterize and sort the critical parameters of semiconductors devices including Leakage Current, Breakdown Voltage, Gain, Saturation Voltages, and offer a comprehensive test parameter library with an easy to use Windows based applications software.   Our device library covers 1000's of the most common devices and can easily be edited for similar parts. Engineering excellence, innovation, creativity and cutting edge technology has made Lorlin equipment well known for testing discrete components.    

               

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Lorlin offers the most affordable small signal and power semiconductor test solutions on the market with capabilities that excel above and beyond any competitor.  Speed, Accuracy, Repeatability, Functionality.  Lorlin gives you the best price and superior performance.

Lorlin's Small Signal and Power Semiconductor Discrete Tester Systems

         XP-8500                  Impact 7BT                    Double Impact                    Rebuilt Testers

Lorlin offers power semiconductor testers for up to 2000 Volts  and 500 Amps

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7BT Tester PDF Brochure     

Double Impact Tester PDF Brochure

Low Leakage Measurement Information PDF

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24/7 World-Wide Sales and Support

Register for Free Technical Support

Lorlin Test Systems       Tel: 508-879-1827           sales@lorlin.com

       


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Lorlin has been selling testers since 1964 and highly regarded as the  world experts  in the science and specialized technology of advanced testing, measurement, analysis and characterization of discrete semiconductor component devices.  Our  technology and capabilities are advanced as a result of years of engineering excellence, innovation,  and creativity.

                                                           Lorlin Test Systems Customer List                         About Lorlin

The Lorlin product line of high performance semiconductor component testing equipment provides the best quality at affordable prices.  

Lorlin semiconductor device testers are used in all component test applications including incoming inspection, quality control, engineering, wafer probe, and production final test.  Lorlin has supplied semiconductor test equipment for over 50 years.   

A historic test system leader with Reliable, Accurate, and Repeatable results.

 

 

 

Copyright© Lorlin Test Systems 2014

All products and the Lorlin Test Systems™ name are trademarked™ and copyrighted©.

Any Lorlin Test Systems, Inc.™ hardware, software or propriety design reproduction is illegal. 

Violators will be criminally prosecuted to the full extent of the law for past or present incidences.