Welcome To Lorlin TEst Systems
50 Years of Business - Over 3000 Customers
Lorlin® manufactures high performance discrete semiconductor test systems offering the highest quality standards, test capability, ease of use, and flexibility at reasonable prices. The semiconductor component testers are designed to accurately verify and check the critical parameters of small signal and power semi devices. The library of parametric tests include breakdown voltages, leakage currents, gain, saturation voltages, RDSon, on-state, off-state, dynamic capacitance among many others. The devices tested can be in a single, array, or hybrid package, such as TO-3, TO-220, SOT-23, TO-18/92, DO4/7, SOIC, SMD and many other standard or custom parts.
The high reliability automatic discrete testers, can be used in all manual and automatic testing applications for Transistors, Darlington's, Diodes, Mosfets, JFETs, Power FETs, Zeners, Rectifiers, Bridges, IGBTs, SCRs, Triacs, Hybrids and Opto-Coupled Devices, ensuring reliable, accurate, and repeatable results. The Lorlin® testers include the most powerfult testing software in the industry and operate under a Windows 7/8/10® 64-BIT OS with a USB 2.0 tester communications interface for the highest performance, speed and accuracy.