Welcome To Lorlin TEst Systems
50 Years of Business - Over 3000 Customers
Lorlin® manufactures and sells high performance discrete semiconductor testers offering the highest quality standards available at affordable prices. The discrete test systems are designed to accurately verify and check the critical parameters of small signal and power semiconductor components. The parametric tests include breakdown voltages, leakage currents, gain, saturation voltages, RDSon, on-state, off-state among many others. The devices tested can be in a single, multi-device array, or hybrid package. such as TO-3, TO-220, TO-92, SOT-23, TO18, DO4, SOIC, DPAK, and any other standard or custom part type. The high reliability automatic discrete testers, can be used in all testing applications for Transistors, Darlington's, Diodes, Mosfets, JFETs, Power FETs, Zeners, Rectifiers, Bridges, IGBTs, SCRs, Triacs, Hybrids and Opto-Coupled Devices, ensuring reliable, accurate, and repeatable results. The Lorlin® testers include the most powerfult testing software in the industry and operate under a Windows 7/8® and up 64-BIT OS with a USB 2.0 tester communications interface for the highest performance, speed and accuracy possible.