Used Semiconductor Testing and Manufacturing Equipment Wanted:
Latest Wanted Listings as of August 1, 2011
Dage BT-24, DD2914 Shear Tester
Wanted and For Sale Older Listings (Over 90 Days Old)
Manufacturer Model Description ID#
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Advantest T6673 logic mixed signal tester |
B064 |
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Advantest Tester T5593- Refurbished |
B041 |
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Anfrage-ESEC Smart Card Bonder (Model 2008xp SC, refurbished) |
B005 |
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AMAT |
B073 |
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AMAT Producer |
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AMAT c5200 DxZ silane base or PETEOS |
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AMAT c5200 RTP |
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AMAT c5200 Radiance |
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AMAT c5200 Epi |
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AMAT c5200 HTF |
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AMAT 0242-34144 |
B022 |
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AMAT 200m Producer Ceramic Heaters (New, Used and Failed only) |
B008 |
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AMAT DPS R1 Metal |
B056 |
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AMAT P9500XR High-Current Ion Implanter, 6" |
B004 |
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Applied Materials 9500xR Implanter |
B003 |
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ASM Plasma IIA PECVD system |
B069 |
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Axitron 2400/2600 G3 (AsP) mocvd |
B073 |
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Blazers 760 electron beam evaporation coating systems |
B020 |
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Boreal2,Camera |
B010 |
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CI 9250/9450 |
B012 |
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Delvotec 6600HS bonder machine |
B054 |
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Disco DFP 8140 |
B053 |
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DNSE WS-820L Wet Etching Systems, 8” |
B021 |
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Eaton |
B042 |
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Eaton |
B042 |
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Ekra E1 Screen Printer |
B063 |
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Epineat Standard System, III-V growth with Arsenides. Automated or able to upgrade |
B074 |
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EPS 3000 Electron Beam Machine 1 set of Scanner Power Supply |
B033 |
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1 set of Scanner Power Supply for Electronic Beam Processing System |
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1 set Scanner Power supply |
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ESPEC EHS 221 |
B014 |
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FICO AMS-11 MR2- Molding System |
B044 |
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F&K 6400 |
B060 |
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F&K DELVOTEC 4400 BONDERS |
B055 |
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FSI ssm Mercury 200mm |
B032 |
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ICOS CI 8250/8450 |
B012 |
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IDI 450 Photresist pump |
B001 |
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IMS XL100 |
B047 |
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Ion Tech RF new/used or parts |
B002 |
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Karl SUSS coater Delta 80 |
B049 |
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KLA/Tencor 6420 Particle Counter |
B065 |
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KLA RS75A or RS75 parts machine |
B030 |
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KOYO VF-5100 |
B038 |
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KOYO VF-5300 |
B038 |
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LAM Isotropic Etcher, 8” |
B040 |
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4520i |
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4520 |
|
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Lintec RAD-2500 8” Semi-auto Wafer Mounter |
B070 |
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LPCVD System for a 6-8” MEMS process |
B037 |
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Mattson Asher Tools |
B036 |
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Mattson Aspen II ICP System, 8” |
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Mattson Aspen III ICP Strip, 12” |
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Mattson Aspen III Dual Chamber Highland ICP Asher, 12” |
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MBE Riber Epincat |
B068 |
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MCA E-Chuck Heater (Any type, any condition) |
B008 |
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MCT-2020 Tester |
B013 |
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MEI (Mech-el) Bonders |
B026 |
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1204-B |
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1204-W |
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829 |
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829-z |
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MT-12-30 quantity 1000 |
B007 |
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MT-22-30 quantity 1000 |
B007 |
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Nextest Maverick I Memory Test Systems |
B029 |
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Nextest Maverick II-PT Memory Testsystem, 64 pins |
B029 |
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NIKON |
B017 |
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NIKON NEXIV VMR6555 |
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NIKON NEXIV VMR3020 |
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B015 |
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STM6-LM |
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X,Y RANGE 250X150mm |
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B016 |
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Wafer Microcope |
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MX61L |
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Orthodyne 360c Heavy Wire Bonder |
B061 |
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Orthodyne M360C Wire Bond Machine |
B054 |
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Portables Multi Gas |
B010 |
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Heavy Duty Oxygen Meter with PC interface |
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Waterproof ExStik II Dissolved Oxygen Meter |
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Dual Laser InfraRed Thermometer |
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LAMTTE 2000 SMARY SPECTROPHOTOMETER 120-220V |
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Digital Microscope, AP 2000 Advanced Compound, 4x,10x,40x,100x,2.0 |
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MP Live Image |
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Producer Ceramic Heater 200mm (any type, 45 ea) (New, Used, Failed only) |
B008 |
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Rasco 1800 handler |
B052 |
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Royce 226 Wire Pull Tester |
B039 |
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Royce 552 Wire Pull Tester |
B039 |
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Royce 580 Wire Pull & Die Shear Tester |
B039 |
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RUDOLPH PRVX3 channel 4500 or 2250 check palte: 1,1,2,2 or 2,2,3,3 |
B018 |
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SCREEN PRINTER |
B023 |
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DEK ELA |
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DEK Horizon 02i |
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DEK Horizon 265 |
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DEK Horizon 03/03i |
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MPM SPM |
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Semitool SDR's. All Models (ST, F and S) |
B001 |
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Shaker table thermaplan |
B024 |
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Shinkawa UTC-1000 Super Wire Bonder, mag/mag |
B031 |
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Shinkawa UTC-1000 super or UTC-2000 super |
B071 |
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SPIN ETCHER |
B021 |
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SEZ SP201 8” |
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SEZ RST-201J 8” |
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SEZ SP203 8” |
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SEZ 4200 8” |
|
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STK E1 Module Sunset MTT29 |
B048 |
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STI 4060 Lead Inspection |
B046 |
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TELPA 300 |
B072 |
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Tencor Flexus 2310 Stress Measurement System |
B065 |
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Tesec 8001 T or T/M test system available with at least 1 station |
B011 |
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Therma Wave M700 ESD Tester |
B050 |
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Thermal Resistance Testers TH-2 50-200 Amp |
B006 |
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Trio Tech HAST-6000X |
B014 |
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Universal 6293C Jumper Wire Inserter |
B023 |
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Universal 6380 RAD8 Inserter |
B023 |
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Universal 6389A RAD8 Inserter with 20 stations |
B023 |
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Universal 6293C Jumper Wire Inserter |
B028 |
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UTC 1000 or UTC 2000 |
B067 |
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Veeco Ion Tech Spector dual ion beam sputtering coating system |
B057 |
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Versatest V3304 Tester (used) |
B035 |
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Westbond 747677E |
B043 |
LIST YOUR EQUIPMENT WANTED HERE
List your semiconductor equipment you have for sale or equipment wanted with our easy form below. Our site gets high visibility to the customers in this industry and gives you more exposure on the web to sell it. Any type of equipment can be listed.
Use Our Simple Form Below to List Your Equipment or email holly@lorlin.com
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General Category of Equipment Wanted:
Bonders, Box Coaters, Burn-In Systems, Centrifuges, Chillers, Clean Rooms, Component Test, IC Testers, Sawing and Slicing, Die Attach, Diffusion Furnaces, Electronic Test Equipment, Ellipsometers, Environmental Chambers, Etchers, Evaporators, Exposure Systems, Final Test, Handlers, Hybrid Equipment, Ion Implanters, Leak Detectors, Marking, Mask Equipment, Wafer Inspection, Microscopes, Ovens, PCB Assembly and Test, Power Supplies, Probers, Pumps, Reactors, Gas Analyzers, Scanning Electron Microscopes, SEM, Screen Printers, Spectrometers, Sputtering Systems, Wafer Stepper Handler Prober, Wet Stations.
We are happy to broker and list your semiconductor equipment you may wish to sell.
___________Use Our Simple Form Below to List Your Equipment or email holly@lorlin.com __________________
Contact holly@lorlin.com 508-879-1827
Lorlin Test Systems
Lorlin Home - Discrete Component Testers

Lorlin Test Systems® manufactures and distributes semiconductor component test systems. Through years of dedicated engineering excellence, proven designs, and achievements, Lorlin is proud to maintain the leading cutting edge technology offered in our products. Lorlin's dynamic and encompassing solutions are tailored to customers specific needs and requirements for virtually any test application.
Proven superior and advanced analog and digital electronics engineering designs for over 40 years utilizing advanced circuitry and technology is why Lorlin products are so desired by engineers. Our visions of the research and development needed to meet the demands of today were realized years ago.
Smooth, flawless and flowing engineering design excellence have yielded success, complete customer satisfaction and overwhelming confidence in Lorlins equipment performance. Our test concepts have been developed in an environment of creative flux and intuition with achievements unsurpassed.
Our flexibility and creativity enable us to fulfill your application desires and targeted test and manufacturing goals while staying within your budget. The parametric testing equipment is used to test, evaluate and analyze the electrical characteristics of semiconductor devices in component testing and semiconductor manufacturing applications such as production and final test, wafer probe and wafer mapping, QC & QA test, incoming inspection, engineering evaluation and characterization, high reliability, and high volume testing.
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