Lorlin Test Systems
Lorlin manufacturers Discrete Component Semiconductor Test Systems for Transistors, Diodes, Zeners, Fets, IGBTs, SCRs, Triacs, Optos, Small Signal and Power Semiconductors. We measure, screen, test, analyze, characterize and sort the critical parameters of semiconductors devices including Leakage Current, Breakdown Voltage, Gain, Saturation Voltages, and a offer a comprehensive test parameter library with an easy to use Windows based applications software. Engineering excellence, innovation, creativity and cutting edge technology has made Lorlin equipment well known for testing discrete components. |
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Factory Rebuilt Lorlin Tester Specials
The Double Impact Tester for Small Signal and Power Semiconductors
Test, Measure, Analyze, Characterize, Sort, Classify
The Above Double Impact Factory Rebuilt System offers 600Volts, 20 Amp, and 5 picoamp resolution for Small Signal and Power Semiconductors and will test, measure, characterize, analyze, sort and classify your discrete semiconductor components like you would not believe. Lorlin will configure it for applications up to 2000 Volts, 500 Amps and three stations for manual or automatic testing with wafer probers and handlers.. Includes the latest Lorlin© Software License® and a One Year Warranty!
One In Stock now for $39,900
Lorlin Double Impact Brochure PDF
The 7BT Discrete Tester for Small Signal and Power Semiconductors
Test, Measure, Analyze, Characterize, Sort, Classify
The Above 7BT Factory Rebuilt System offers 600Volts, 20 Amp, and 5 picoamp resolution for Small Signal and Power Semiconductors. Lorlin will configure it for applications up to 2000 Volts, 500 Amps and three stations for manual or automatic testing with wafer probers and handlers. Includes the latest Lorlin© Double Impact Software® License and a One Year Warranty!
One In Stock now for $35,900
Factory Reconditioned Test Stations
400 Amp High Rebuilt Current Test Station above is available for $9,900
2000 Volt Rebuilt Test Station is above is available for $17,900
SS100 and SS150 FET Device Array, Opto and Hybrid Super Stations Rebuilt and Available Now
Lorlin offers power semiconductor testers for up to 2000 Volts and 500 Amps
Used Eaton Dataspec Tester with Lorlin PC Software Available
Used Impact 3 Tester Available
Wanted now - ASM 830, ASM 828, ASM 898
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Contact David Bradley for Sales and Service USA
Direct Line 339-502-2919
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Asia and Pacific Rim - Jimmy Lim
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Europe - Klaus Ost
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China - Guo Quanshun GRTCC
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United Kingdom and Ireland - uk@lorlin.com
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New - List your Equipment for Sale or Wanted
7BT Benchtop Test System The 7BT Tester PDF Brochure
Double Impact Semiconductor Test System The Double Impact Tester Brochure PDF
Lorlin's product line of high performance semiconductor component testing equipment provides the best quality at affordable prices. Lorlin semiconductor device testers are used in all component test applications including incoming inspection, quality control, engineering, wafer probe, and production final test. Lorlin has supplied semiconductor test equipment for over 40 years. A historic test system leader with Reliable, Accurate, and Repeatable results.
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Lorlin Test Systems
Tel: 508-879-1827
sales@lorlin.com
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Lorlin Test Systems has been selling testers since 1964 and highly regarded as the
world experts in the science and specialized technology of advanced testing,
measurement, analysis and characterization of discrete semiconductor component devices.
Our technology and capabilities are advanced as a result of years of
engineering excellence, innovation, and creativity.
Copyright© Lorlin Test Systems 2010