Lorlin Test Systems

Lorlin manufacturers Discrete Component Semiconductor Test Systems for Transistors, Diodes, Zeners, Fets, IGBTs, SCRs, Triacs, Optos, Small Signal and Power Semiconductors.   We measure, screen, test,  analyze, characterize and sort the critical parameters of semiconductors devices including Leakage Current, Breakdown Voltage, Gain, Saturation Voltages, and a offer a comprehensive test parameter library with an easy to use Windows based applications software.   Engineering excellence, innovation, creativity and cutting edge technology has made Lorlin equipment well known for testing discrete components.    

               

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7BT Benchtop Tester    Double Impact Tester

New - List Your Semiconductor Equipment for Sale or Wanted

  Factory Rebuilt Lorlin Tester Specials

The Double Impact Tester for Small Signal and Power Semiconductors

Test, Measure, Analyze, Characterize, Sort, Classify

   

The Above  Double Impact Factory Rebuilt System offers 600Volts, 20 Amp, and 5 picoamp resolution for Small Signal and Power Semiconductors and will test, measure, characterize, analyze, sort and classify your discrete semiconductor components like you would not believe.  Lorlin will configure it for applications up to 2000 Volts, 500 Amps and three stations for manual or automatic testing with wafer probers and  handlers.. Includes the latest Lorlin© Software License® and a One Year Warranty

One In Stock now for $39,900

Lorlin Double Impact Brochure PDF

 

The 7BT Discrete Tester for Small Signal and Power Semiconductors

Test, Measure, Analyze, Characterize, Sort, Classify


The Above  7BT Factory Rebuilt System offers 600Volts, 20 Amp, and 5 picoamp resolution for Small Signal and Power Semiconductors. Lorlin will configure it for applications up to 2000 Volts, 500 Amps and three stations for manual or automatic testing with wafer probers and handlers.  Includes the latest Lorlin© Double Impact Software® License and a One Year Warranty!

One In Stock now for $35,900

The Lorlin 7BT Brochure PDF

 

Factory Reconditioned Test Stations 

400 Amp High Rebuilt Current Test Station above is available for $9,900

2000 Volt Rebuilt Test Station is above is available for  $17,900

SS100 and SS150 FET Device Array, Opto and Hybrid Super Stations Rebuilt and Available Now   



Lorlin offers power semiconductor testers for up to 2000 Volts  and 500 Amps

 

Used Eaton Dataspec Tester with Lorlin PC Software Available

Used Impact 3 Tester Available

Wanted now - ASM 830, ASM 828, ASM 898

 

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Contact  David Bradley for Sales and Service  USA

Direct Line 339-502-2919

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Asia and Pacific Rim - Jimmy Lim

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Europe - Klaus Ost

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China - Guo Quanshun  GRTCC

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United Kingdom and Ireland - uk@lorlin.com

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Pricing and Quotes

New - List your Equipment for Sale or Wanted

7BT Benchtop Test System    The 7BT Tester PDF Brochure

Double Impact Semiconductor Test System   The Double Impact Tester Brochure PDF

Discrete Component Testers

Lorlin Company Information

Lorlin's product line of high performance semiconductor component testing equipment provides the best quality at affordable prices.  Lorlin semiconductor device testers are used in all component test applications including incoming inspection, quality control, engineering, wafer probe, and production final test.  Lorlin has supplied semiconductor test equipment for over 40 years.   A historic test system leader with Reliable, Accurate, and Repeatable results.

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Lorlin Test Systems        Tel: 508-879-1827           sales@lorlin.com

       


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Lorlin Test Systems has been selling testers since 1964 and highly regarded as the  world experts  in the science and specialized technology of advanced testing, measurement, analysis and characterization of discrete semiconductor component devices.  Our  technology and capabilities are advanced as a result of years of engineering excellence, innovation,  and creativity.

 

Copyright© Lorlin Test Systems 2010