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Low Cost Discrete Tester Solutions

High Speed, Reliable and Accurate

We can configure each tester for any application to 2000 Volts, 500 Amps

Contact us for availability and a quotation sales@lorlin.com 

Lorlin Double Impact Tester - Parametric Testing of Discrete Semiconductors

Incoming Inspection, QC, Engineering, Production Test, Wafer Test

bulletSmall Signal and Power Devices
bulletTransistors, Diodes, FETs, Jfets, IGBTs, SCRs, Triacs, Zeners, Modules
bullet600 Volt, 20 Amp Standard Configuration
bulletPC Software Package
bulletManual Test Station
bulletOptional Configurations Available for up to 2000 volts and/or 200 Amps
bulletOptional Opto, Hybrid and Array Stations Available
bullet1 Year Warranty
bulletPC and Lorlin Software License Included

Lorlin 7BT Benchtop Tester

bulletSmall Signal and Power Devices
bulletTransistors, Diodes, Zeners, FETs, Jfets, SCRs, Triacs, Power Modules
bullet600 Volt, 20 Amp Configuration Standard
bulletPC Software Package
bulletOptional Configurations Available for up to 2000 volts and/or 400 Amps
bulletOptional Opto, Hybrid and Array Stations Available
bullet1 Year Warranty
bulletPC and Lorlin Software License Included

Lorlin Test Systems®                                         

Tel: 508-879-1827     Email: sales@lorlin.com

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Semiconductor Testers  2000 Volts, 200 Amps

Diode Measuring System

Semiconductor Handlers for ICs, SMDs, SOT, Discretes, Axial and Radial Devices

Semiconductor Testers for Discrete Components - Automated PC Based Tester

Semiconductor Testers for High Reliablity, Quality Control, Incoming Inspection Applications

Thermal Resistance Testers for Measurement of Delta VBE of Power Semiconductors

Used and Demo Semiconductor Component Handlers and Testers

Catalogs, Pricing and Information Requests for Semiconductor Testers and Handlers

Copyright © 2006 Lorlin Test Systems, Inc.