Used and Demo Semiconductor Component Testers and Handlers for Mixed Signal, Linear, Discrete, Digital, Opto and other Devices

Lorlin Test Systems

Used and Demo Testers

Trade in or Sell Your Semiconductor Equipment

Low Cost Discrete Tester Solutions

High Speed, Reliable and Accurate

We can configure each tester for any application to 2000 Volts, 500 Amps

Lorlin Double Impact Tester - Parametric Testing of Discrete Semiconductors

Incoming Inspection, QC, Engineering, Production Test, Wafer Test

Small Signal and Power Devices

Transistors, Diodes, FETs, Jfets, IGBTs, SCRs, Triacs, Zeners, Modules

600 Volt, 20 Amp Standard Configuration

PC Software Package

Manual Test Station

Optional Configurations Available for up to 2000 volts and/or 200 Amps

Optional Opto, Hybrid and Array Stations Available

1 Year Warranty

PC and Lorlin Software License Included

Lorlin 7BT Benchtop Tester

Small Signal and Power Devices

Transistors, Diodes, Zeners, FETs, Jfets, SCRs, Triacs, Power Modules

600 Volt, 20 Amp Configuration Standard

PC Software Package

Optional Configurations Available for up to 2000 volts and/or 400 Amps

Optional Opto, Hybrid and Array Stations Available

1 Year Warranty

PC and Lorlin Software License Included

Lorlin Test Systems® Tel: 508-879-1827 sales@lorlin.com

Lorlin Home Page

Trade in, Sell Your Semiconductor Equipment or List Wanted Equipment

Catalogs, Pricing and Information Requests for Semiconductor Testers and Handlers

Lorlin Test Systems® manufactures and distributes semiconductor component test systems. Through years of dedicated engineering excellence, proven designs, and achievements, Lorlin is proud to maintain the leading cutting edge technology offered in our products. Lorlin's dynamic and encompassing solutions are tailored to customers specific needs and requirements for virtually any test application.

Proven superior and advanced analog and digital electronics engineering designs for over 40 years utilizing advanced circuitry and technology is why Lorlin products are so desired by engineers. Our visions of the research and development needed to meet the demands of today were realized years ago.

Smooth, flawless and flowing engineering design excellence have yielded success, complete customer satisfaction and overwhelming confidence in Lorlins equipment performance. Our test concepts have been developed in an environment of creative flux and intuition with achievements unsurpassed.

Our flexibility and creativity enable us to fulfill your application desires and targeted test and manufacturing goals while staying within your budget. The parametric testing equipment is used to test, evaluate and analyze the electrical characteristics of semiconductor devices in component testing and semiconductor manufacturing applications such as production and final test, wafer probe and wafer mapping, QC & QA test, incoming inspection, engineering evaluation and characterization, high reliability, and high volume testing.

Bonders, Box Coaters, Burn-In Systems, Centrifuges, Chillers, Clean Rooms, Component Test, IC Testers, Sawing and Slicing, Die Attach, Diffusion Furnaces, Electronic Test Equipment, Ellipsometers, Environmental Chambers, Etchers, Evaporators, Exposure Systems, Final Test, Handlers, Hybrid Equipment, Ion Implanters, Leak Detectors, Marking, Mask Equipment, Wafer Inspection, Microscopes, Ovens, PCB Assembly and Test, Power Supplies, Probers, Pumps, Reactors, Gas Analyzers, Scanning Electron Microscopes, SEM, Screen Printers, Spectrometers, Sputtering Systems, Wafer Stepper Handler Prober, Wet Stations.