Lorlin Test Systems

 

Thermal Resistance Testers

 
 

 













TH Series Testers for Measurement of Delta VBE, Thermal Resistance

The TH Series is designed to measure the  thermal resistance of power semiconductors such as diodes, transistors, thyristors, power fets, darlington transistors and igbts.

 

 

 

 

 

Adjustable ranges:

Measuring current: 1 ... 299 mAmps*

Accuracy: 1% adj. ±1 mAmp.

close by max. UF:4 V

Load current: 1 ... 199.9 Amps*

Accuracy: 1% adj. ±1 Amp.

close by max. UF: 8 V

Duration of power pulse: 2 ... 9999.9 msec*

Accuracy: 0.1% adj. ±0.1 msec.

Interval between the end

of the power pulse and the

following measuring: 100 ... 990 µsec.

Accuracy: 0.1% adj. ±2 µsec.

Adjustable range for

temperature coefficient: 0 ... 7.99 mV/K

Value limit for RTH: 0 ... 99.999 K/W

*Amps vary with Model of TH Series.

 

Displays:

Forward voltage at

measuring current VFm: 0...3.999 V

Accuracy: 0.5% rdg. ± 1 digit

Forward voltage at

load current VFL: 0...7.999 V

Accuracy: 0.5% rdg. ± 1 digit

Display of the temperature

caused voltage variation D VFm: -80...+300 mV

Accuracy: 0.5% rdg. ± 2 digit

Digital display of the determined

Thermal resistance: 0...99.999 K/W

Download our Thermal Tester Brochure in PDF

Trade in or Sell Your Semiconductor Equipment or List Equipment Wanted

 

Lorlin Test Systems  Tel: 508-879-1827   sales@lorlin.com  

Lorlin Test Systems® manufactures and distributes semiconductor component test systems. Through years of dedicated engineering excellence, proven designs, and achievements, Lorlin is proud to maintain the leading cutting edge technology offered in our products. Lorlin's dynamic and encompassing solutions are tailored to customers specific needs and requirements for virtually any test application.

Proven superior and advanced analog and digital electronics engineering designs for over 40 years utilizing advanced circuitry and technology is why Lorlin products are so desired by engineers.  Our visions of the research and development needed to meet the demands of today were realized years ago. 

Smooth, flawless and flowing engineering design excellence have yielded success, complete customer satisfaction and overwhelming confidence in Lorlins equipment performance. Our test concepts have been developed in an environment of creative flux and intuition with achievements unsurpassed.

Our flexibility and creativity enable us to fulfill your application desires and targeted test and manufacturing goals while staying within your budget. The parametric testing equipment is used to test, evaluate and analyze the electrical characteristics of semiconductor devices in component testing and semiconductor manufacturing applications such as production and final test, wafer probe and wafer mapping, QC & QA test, incoming inspection, engineering evaluation and characterization, high reliability, and high volume testing.  

 

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