      
|
 |
 |
TH Series Testers for Measurement of Delta VBE, Thermal Resistance
The TH Series is designed to measure the thermal resistance of power semiconductors such as diodes, transistors, thyristors, power fets, darlington transistors and igbts.
Adjustable ranges:
Measuring current: 1 ... 299 mAmps*
Accuracy: 1% adj. ±1 mAmp.
close by max. UF:4 V
Load
current: 1 ... 199.9 Amps*
Accuracy: 1% adj. ±1 Amp.
close by max. UF: 8 V
Duration of power pulse: 2 ... 9999.9 msec*
Accuracy: 0.1% adj. ±0.1 msec.
Interval between the end
of the power pulse and the
following measuring: 100 ... 990 µsec.
Accuracy: 0.1% adj. ±2 µsec.
Adjustable range for
temperature coefficient: 0 ... 7.99 mV/K
Value limit for RTH: 0 ... 99.999 K/W
*Amps vary with Model of TH Series.
Displays:
Forward voltage at
measuring current VFm: 0...3.999 V
Accuracy: 0.5% rdg. ± 1 digit
Forward voltage at
load current VFL: 0...7.999 V
Accuracy: 0.5% rdg. ± 1 digit
Display of the temperature
caused voltage variation D VFm: -80...+300 mV
Accuracy: 0.5% rdg. ± 2 digit
Digital display of the determined
Thermal resistance: 0...99.999 K/W
Download our Thermal Tester Brochure in PDF
Lorlin Test Systems
Tel: 508-879-1827 Email: sales@lorlin.com
Semiconductor Testers 2000 Volts, 200 Amps
Semiconductor Handlers for ICs, SMDs, SOT, Discretes, Axial and Radial Devices
Semiconductor Testers for Discrete Components - Automated PC Based Tester
Semiconductor Testers for High Reliablity, Quality Control, Incoming Inspection Applications
Thermal Resistance Testers for Measurement of Delta VBE of Power Semiconductors
Used and Demo Semiconductor Component Handlers and Testers
Catalogs, Pricing and Information Requests for Semiconductor Testers and Handlers
Copyright © 2006 Lorlin Test Systems