Lorlin Test Systems now offering benchtop tester Discrete component test systems NEW TEST SYSTEMS   Testers for Diodes, High Power Transistors, Bridge Rectifiers and Optoelectric Applications.   All testers have the following features: Large 40 characters x 16 lines or 240 dots x 128 dots LC display and 25-key keyboard High voltage is generated by a small high frequency transformer Versatile interface settings for easy connection with machine handlers 4 to 10 sets of programmed parameters can be stored RS-232 serial port interface Real contact resistance value test Slot mounted PC boards with on-board calibration Standard 19" instrument rack case The testers are available for either 220V/50Hz or 110V/60Hz AC power source. All parameters can be set via the keyboard or downloaded from an IBM compatible PC via RS 232 interface. The PC download software is optionally available. All testers can be linked with the handler via a direct interface or by PLC. The following test systems are available: 7BT-800S (Diode Tester) Model DS-800S is designed to test VF, VZ, Delta VZ, IR and Delta IR of regular and Schottky diodes. 7 bin grades (incl. test fail and bad contact) are programmable.   7BT-800T (Diode/Transistor Tester) Model DS-800T is designed to test VF, VZ, Delta VZ and IR of 2 diodes building a power transistor (can often be found in TO-220 or TO-3P packages). 7 bin grades (incl. test fail and bad contact) are programmable. 7BT-812T (Diode/Transistor Tester) Model DS-812T is designed to test VF, IR and Delta IR of 2 diodes building a power transistor (can often be found in TO-220 or TO-3P packages). 2 components can be tested simultaneously 7 bin grades (incl. test fail and bad contact) are programmable. 7BT-4148 (Diode Tester) Model DS-4148 is a tester designed to test 1N4148 small signal diodes. Test items include VF and IR. 7 bin grades (incl. test fail and bad contact) are programmable. 7BT-VS-801 (Diode Tester) Model TVS-801 is designed to test and sort uni-polar (rectifier) and bipolar TVS, Schottky and zener diodes. The test items include VF, VZ, Delta VZ, IR (%VZ) and Delta IR. 7 bin grades (incl. test fail and bad contact) are programmable. 7BT-800 (Diode Tester) Model DVF-800 is designed to test the VF and Delta VF of different kinds of diodes. 7 bin grades (incl. test fail and bad contact) are programmable. 7BT-800 (Diode Tester) Model ZT-800 is a tester designed to test VF, IR, VZ and dynamic impedance Zzt & Zzk of zener diodes. It also can test unidirectional and bi-directional zener diodes. 7 bin grades (incl. test fail and bad contact) are programmable. Series 7BT-FR-800 (Diode Testers) The FR-800 series was designed to test the diode reverse recovery time (Trr), also known as switching time, of many different diode products. Suitable for single diode packages, for multi diode bridge rectifiers and for diodes in power transistor packages like TO-220 or TO-3P. 7 bin grades (incl. test fail and bad contact) are programmable. 7BT-SG-800 (Surge Tester) Model SG-800 can generate a reverse surge current and test the VR voltage. Another test method is to test the IR voltage first and than to supply a constant reverse power (by controlled IR). The test items include VF and PIV. Model SG-800 can be applied to test all silicon diode types. 5 bin grades (incl. bad contact) are programmable. Please contact Sales@lorlin.com for further details. All testers offered are fully certified by mil-spec compliance companies and meet all industry standards. Our manufacturing facility has been honored to receive the highest awards for all ISO-9000 compliance.