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Discrete Component and IC Handlers
Affordably Priced
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SMD and all types of IC Components: Loose, Sticks/Tubes, Taped, Trays
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Discrete Components: Loose, Sticks/Tubes, Taped, Trays
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Memory Module Devices
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Labeling and Marking
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Mutiple Test Site Options
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A Large Variety of Input and Output Options available
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Ambient and Hot Temperature Capability.
Lorlin can configure component handlers for most all semiconductor device applications offering a wide range of choices for input, output, device contacting and handling requirements. Our handlers are reliable, fast and affordable priced. Contact Lorlin today and we will configure a handler for your application.
Download our Handler Brochure in PDF
Trade in, Sell Your Semiconductor Equipment or List Wanted Equipment
Lorlin Test Systems® Tel: 508-879-1827 Email: sales@lorlin.com
Bonders, Box Coaters, Burn-In Systems, Centrifuges, Chillers, Clean Rooms, Component Test, IC Testers, Sawing and Slicing, Die Attach, Diffusion Furnaces, Electronic Test Equipment, Ellipsometers, Environmental Chambers, Etchers, Evaporators, Exposure Systems, Final Test, Handlers, Hybrid Equipment, Ion Implanters, Leak Detectors, Marking, Mask Equipment, Wafer Inspection, Microscopes, Ovens, PCB Assembly and Test, Power Supplies, Probers, Pumps, Reactors, Gas Analyzers, Scanning Electron Microscopes, SEM, Screen Printers, Spectrometers, Sputtering Systems, Wafer Stepper Handler Prober, Wet Stations.
Lorlin Test Systems® manufactures and distributes semiconductor component test systems. Through years of dedicated engineering excellence, proven designs, and achievements, Lorlin is proud to maintain the leading cutting edge technology offered in our products. Lorlin's dynamic and encompassing solutions are tailored to customers specific needs and requirements for virtually any test application.
Proven superior and advanced analog and digital electronics engineering designs for over 40 years utilizing advanced circuitry and technology is why Lorlin products are so desired by engineers. Our visions of the research and development needed to meet the demands of today were realized years ago.
Smooth, flawless and flowing engineering design excellence have yielded success, complete customer satisfaction and overwhelming confidence in Lorlins equipment performance. Our test concepts have been developed in an environment of creative flux and intuition with achievements unsurpassed.
Our flexibility and creativity enable us to fulfill your application desires and targeted test and manufacturing goals while staying within your budget. The parametric testing equipment is used to test, evaluate and analyze the electrical characteristics of semiconductor devices in component testing and semiconductor manufacturing applications such as production and final test, wafer probe and wafer mapping, QC & QA test, incoming inspection, engineering evaluation and characterization, high reliability, and high volume testing.
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