Discrete Semiconductor Component Testers for Transistors, IGBTs, SCRs, FETs, MCTs, Optos, Diodes and Zeners

Lorlin Test Systems

Discrete Semiconductor Component Testers

7BT Automatic Tester for Small Signal and Power Devices Up to 2000 Volts, 500 Amps Capability Powerful PC Applications Software with Test Parameter Library Handler and Prober Interfaces Hybrid and Array Test Stations

PDF 7BT Brochure and Specifications

Double Impact Automatic Tester for Small Signal and Power Devices Up to 2000 Volts, 500 Amps Capability Powerful PC Applications Software with Test Parameter Library Handler and Prober Interfaces Hybrid and Array Test Stations Multiplex Power Supplies Expandable to Five Test Stations

PDF Double Impact Brochure and Specifications

Over 40 years of engineering excellence, innovation, creativity and advanced technology is what made Lorlin testers so popular in the industry. Proven out test designs, repeatability, stability, accuracy are among the many reasons so many test engineers specify Lorlin. The Impact series testers are a result of the years of dedication to research and development. There are no other testers more reliable and the Impact series are considered the industry workhorse for testing. Both new and factory reconditioned units are available with the same warranty, specifications and licensed software. The Impact systems have tested billions of parts throughout the world and remain the number one source for testing small signal and power semiconductor components.

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Lorlin Test Systems 08 sales@lorlin.com 508-879-1827

Lorlin Test Systems® manufactures and distributes semiconductor component test systems. Through years of dedicated engineering excellence, proven designs, and achievements, Lorlin is proud to maintain the leading cutting edge technology offered in our products. Lorlin's dynamic and encompassing solutions are tailored to customers specific needs and requirements for virtually any test application.

Proven superior and advanced analog and digital electronics engineering designs for over 40 years utilizing advanced circuitry and technology is why Lorlin products are so desired by engineers. Our visions of the research and development needed to meet the demands of today were realized years ago.

Smooth, flawless and flowing engineering design excellence have yielded success, complete customer satisfaction and overwhelming confidence in Lorlins equipment performance. Our test concepts have been developed in an environment of creative flux and intuition with achievements unsurpassed.

Our flexibility and creativity enable us to fulfill your application desires and targeted test and manufacturing goals while staying within your budget. The parametric testing equipment is used to test, evaluate and analyze the electrical characteristics of semiconductor devices in component testing and semiconductor manufacturing applications such as production and final test, wafer probe and wafer mapping, QC & QA test, incoming inspection, engineering evaluation and characterization, high reliability, and high volume testing.

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