Lorlin Test Systems
 

Double Impact Semiconductor Tester

 
     Discrete Testers

 

Small Signal and Power Discrete Semiconductor Tester

Parametric Measurements of Leakage Current, Breakdown Voltage, Gain, Saturation Voltage, On-State, Off-State, AC , Impedance, Transconductance, Capacitance

Transistors, Diodes, IGBTs, Hybrids, FETs, Jfets, Zeners, IGBTs, SCRs, Triacs, Optos

  • 600 to 2000 Volts

  • 20 to 500 Amps

  • 1 to 5 Test Stations

  • Manual or Handler/Prober Interfaces

  • Powerful PC Applications Software Package

  • Hybrid and Array Stations

  • Prices start under $50,000

 

 

 

 

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Tel: 508-879-1827     Email: sales@lorlin.com 

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