Discrete Component Tester for Power and Small Signal Semiconductor Components for both Packaged Finished Parts and Wafers.

Lorlin Test Systems

Double Impact Semiconductor Tester

Small Signal and Power Discrete Semiconductor Tester

Parametric Measurements of Leakage Current, Breakdown Voltage, Gain, Saturation Voltage, On-State, Off-State, AC , Impedance, Transconductance, Capacitance

Test, Measure, Analyze, Characterize, Sort, Classify

Transistors, Diodes, IGBTs, Hybrids, FETs, Jfets, Zeners, IGBTs, SCRs, Triacs, Optos

The Double Impact Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.

600 to 2000 Volts
20 to 500 Amps
1 to 5 Test Stations
Manual or Handler/Prober Interfaces
Powerful PC Applications Software Package
Hybrid and Array Stations
Statistical Analysis
High Reliability Software
Prices start under $50,000

Over 40 years of engineering excellence, innovation, creativity and advanced technology is what made Lorlin testers so popular in the industry. Proven out test designs, repeatability, stability, accuracy are among the many reasons so many test engineers specify Lorlin. The Double Impact tester is just one of the results of years of dedication to research and development. There is no other tester more reliable and is known as the industry workhorse for testing discrete components. Both new and factory reconditioned units are available with the same warranty, specifications and licensed software. The Impact systems have tested billions of parts throughout the world and remain the number one source for testing small signal and power semiconductor components.

Double Impact Tester Brochure in PDF Format

Pricing and Quotes for the Double Impact Tester

Trade in, Sell Your Semiconductor Equipment or List Wanted Equipment

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Lorlin Test Systems® Tel: 508-879-1827 Email: sales@lorlin.com

Lorlin Home Page

Lorlin Test Systems® manufactures and distributes semiconductor component test systems. Through years of dedicated engineering excellence, proven designs, and achievements, Lorlin is proud to maintain the leading cutting edge technology offered in our products. Lorlin's dynamic and encompassing solutions are tailored to customers specific needs and requirements for virtually any test application.

Proven superior and advanced analog and digital electronics engineering designs for over 40 years utilizing advanced circuitry and technology is why Lorlin products are so desired by engineers. Our visions of the research and development needed to meet the demands of today were realized years ago.

Smooth, flawless and flowing engineering design excellence have yielded success, complete customer satisfaction and overwhelming confidence in Lorlins equipment performance. Our test concepts have been developed in an environment of creative flux and intuition with achievements unsurpassed.

Our flexibility and creativity enable us to fulfill your application desires and targeted test and manufacturing goals while staying within your budget. The parametric testing equipment is used to test, evaluate and analyze the electrical characteristics of semiconductor devices in component testing and semiconductor manufacturing applications such as production and final test, wafer probe and wafer mapping, QC & QA test, incoming inspection, engineering evaluation and characterization, high reliability, and high volume testing.

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