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About Lorlin Test Systems
Component testers for small signal and power discrete semiconductor devices.
Lorlin Test Systems® manufactures and distributes semiconductor component test systems. Through years of dedicated engineering excellence, proven designs, and achievements, Lorlin is proud to maintain the leading cutting edge technology offered in our products. Lorlin's dynamic and encompassing solutions are tailored to customers specific needs and requirements for virtually any test application.
Proven superior and advanced analog and digital electronics engineering designs for over 40 years utilizing advanced circuitry and technology is why Lorlin products are so desired by engineers. Our visions of the research and development needed to meet the demands of today were realized years ago.
Smooth, flawless and flowing engineering design excellence have yielded success, complete customer satisfaction and overwhelming confidence in Lorlins equipment performance. Our test concepts have been developed in an environment of creative flux and intuition with achievements unsurpassed.
Our flexibility and creativity enable us to fulfill your application desires and targeted test and manufacturing goals while staying within your budget. The parametric testing equipment is used to test, evaluate and analyze the electrical characteristics of semiconductor devices in component testing and semiconductor manufacturing applications such as production and final test, wafer probe and wafer mapping, QC & QA test, incoming inspection, engineering evaluation and characterization, high reliability, and high volume testing.
Lorlin® device test systems can test, analyze
and evaluate numerous devices and components including bipolar transistors
(BJT), field effect transistors (FET), insulated gate bipolar
transistors (IGBT), silicon controlled rectifiers (SCR), triacs,
diodes, zeners, bridge rectifiers, and opto coupled devices.
Lorlin® can configure the test system to suite your particular
application with voltages up to 2000 volts and currents up to 500
amps. Lorlin® is well known for FET and IGBT testing capabilities
including Lorlin's® ultra low leakage testing in the pico and
femto amp regions. The discrete device test equipment can be
configured in any combination for up to five test stations in
manual, prober or handler test modes.
Lorlin
Test Systems®, after 40 years in business with over 3000 system
installations world-wide, is acknowledged for supplying repeatable,
accurate, stable and reliable semiconductor testing equipment. Lorlin®
also prides itself on the customer support that is provided to the
semiconductor industry as Lorlin® is one of the few ATE
manufactures that still supports equipment sold 20 to 30 years ago.
Lorlin® is very flexible and works closely with each customer to
offer the best test solutions and services at affordable prices. High
performance, reliability, quality and low cost test solutions have
made Lorlin an industry leader in semiconductor component test. Engineering
Excellence, Innovation, Creativity and Advanced Technology is why
Lorlin products are the most specified testers in this
industry. Billions of parts have be tested and classified
with 100% confidence.
Trade in or Sell Your Semiconductor Equipment or List Wanted Equipment
Lorlin Test Systems® Tel: 508-879-1827 Email: sales@lorlin.com
Lorlin Test Systems® manufactures and distributes semiconductor component test systems. Through years of dedicated engineering excellence, proven designs, and achievements, Lorlin is proud to maintain the leading cutting edge technology offered in our products. Lorlin's dynamic and encompassing solutions are tailored to customers specific needs and requirements for virtually any test application.
Proven superior and advanced analog and digital electronics engineering designs for over 40 years utilizing advanced circuitry and technology is why Lorlin products are so desired by engineers. Our visions of the research and development needed to meet the demands of today were realized years ago.
Smooth, flawless and flowing engineering design excellence have yielded success, complete customer satisfaction and overwhelming confidence in Lorlins equipment performance. Our test concepts have been developed in an environment of creative flux and intuition with achievements unsurpassed.
Our flexibility and creativity enable us to fulfill your application desires and targeted test and manufacturing goals while staying within your budget. The parametric testing equipment is used to test, evaluate and analyze the electrical characteristics of semiconductor devices in component testing and semiconductor manufacturing applications such as production and final test, wafer probe and wafer mapping, QC & QA test, incoming inspection, engineering evaluation and characterization, high reliability, and high volume testing.
Bonders, Box Coaters, Burn-In Systems, Centrifuges, Chillers, Clean Rooms, Component Test, IC Testers, Sawing and Slicing, Die Attach, Diffusion Furnaces, Electronic Test Equipment, Ellipsometers, Environmental Chambers, Etchers, Evaporators, Exposure Systems, Final Test, Handlers, Hybrid Equipment, Ion Implanters, Leak Detectors, Marking, Mask Equipment, Wafer Inspection, Microscopes, Ovens, PCB Assembly and Test, Power Supplies, Probers, Pumps, Reactors, Gas Analyzers, Scanning Electron Microscopes, SEM, Screen Printers, Spectrometers, Sputtering Systems, Wafer Stepper Handler Prober, Wet Stations.
Lorlin Test Systems PO Box 3099 Framingham, MA 01705
Copyright © 2010 Lorlin Test Systems