Lorlin Test Systems

About Lorlin 

Lorlin Test Systems® manufactures and distributes semiconductor test systems and handlers. The parametric testing equipment is used to test, evaluate and analyze the electrical characteristics of semiconductor devices in component testing and semiconductor manufacturing applications such as production and final test, wafer probe and wafer mapping, QC & QA test, incoming inspection, engineering evaluation and characterization, high reliability, and high volume testing.  

Lorlin® device test systems can test, analyze and evaluate numerous devices and components including mixed signal, linear, digital, leds, optos, passives, bipolar transistors (BJT), field effect transistors (FET), insulated gate bipolar transistors (IGBT), silicon controlled rectifiers (SCR), triacs, diodes of many types, programmable unijunction transistors (PUT), unijunction transistors (UJT), transient voltage suppressors (TVS), as well as opto coupled devices.   Up to 256 pins are offered for Lorlin IC testers.

Lorlin's® component test capabilities include standard dc and ac parametric analysis as well most all dynamic tests. Lorlin offers dedicated testers for switching time, recovery time, thermal resistance, and many other dynamic requirements.  Lorlin® can also interface and integrate a wide variety of test and measurement instrumentation to our testers for customers that may want to perform a special test such as variable capacitance , switching times, recovery times, inductive load, thermal resistance, or high precision resistance testing in conjunction with the Lorlin® test parameters.

Lorlin® can configure the test system to suite your particular application with voltages up to 3000 volts and currents up to 1500 amps. Lorlin® is well known for FET and IGBT testing capabilities including Lorlin's® ultra low leakage testing in the pico and femto amp regions. The discrete device test equipment can be configured in any combination for up to five test stations in manual, prober or handler test modes. The Lorlin® testers offer the highest throughput rates available in both single and parallel test modes.  The mixed signal, linear and digital testers offer outstanding performance at affordable costs never before achieved.  The Lorlin KAT-7000 is by far the most advanced and flexible dedicated IC tester available today.

Lorlin® is located in Natick, MA USA, 20 miles west of Boston.  Logan International Airport and Worcester Airports are closest for visiting the facility.  Lorlin Test Systems®, after 35 years in business with over 3000 system installations world-wide, is acknowledged for supplying repeatable, accurate, and reliable semiconductor testing equipment. Lorlin® also prides itself on the customer support that is provided to the semiconductor industry as Lorlin® is one of the few ATE manufactures that still supports equipment sold 20 to 30 years ago. Lorlin® is very flexible and works closely with each customer to offer the best test solutions at affordable prices.  High performance, reliability, quality and low cost test solutions have made Lorlin an industry leader in semiconductor component test.  

Lorlin Test Systems®  

Tel: 508-879-1827      Email: sales@lorlin.com

Power Semiconductor Testers for Manual Applications 2000 Volts, 200 Amps

Power Semiconductor Testers for Manual Applications 4000 Volts, 2000 Amps

Semiconductor Handlers for ICs, SMDs, SOT, Discretes, Axial and Radial Devices

Semiconductor Testers for Discrete Components - Automated PC Based Tester

Semiconductor Testers for High Reliablity, Quality Control, Incoming Inspection Applications

Thermal Resistance Testers for Measurement of Delta VBE of Power Semiconductors

Used and Demo Semiconductor Component Handlers and Testers

Catalogs, Pricing and Information Requests for Semiconductor Testers and Handlers

Copyright © 2001 Lorlin Test Systems

Lorlin Test Systems  PO Box 488 Southborough, MA 01772 USA