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Test, Measure, Analyze, Characterize, Sort, Classify
Transistors, Diodes, FETs, Jfets, Zeners, IGBTs, MCTs, SCRs, Triacs, Optos, Hybrids, Arrays
Parametric Testing of Leakage Current, Breakdown Voltage, Gain, AC, On-State Tests, Off-State Tests, Saturation Voltage, Impedance, Transconductance, Capacitance, and More
The Impact 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
- 6000 to 2000 Volts
- 20 to 500 Amps
- 3 Station Capability
- Handler & Prober Interfaces
- PC Applications Software
- Fast, Accurate, Repeatable
- Hybrid, Array Station
- Prices start Under $50,000
- New 2KV, 200A Version
A variety of test stations can accommodate almost any application including incoming inspection, final test, wafer probe, quality control, and component characterization. The tester is controlled by a Pentium PC with Lorlin's PC Application Software.
Over 40 years of engineering excellence, innovation, creativity and advanced technology is what made Lorlin testers so popular in the industry. Proven out test designs, repeatability, stability, accuracy are among the many reasons so many test engineers specify Lorlin. The Impact 7BT tester is a result of the years of dedication to research and development. There is no other tester more reliable and is the industry workhorse. Both new and factory reconditioned units are available with the same warranty, specifications and licensed software. The Impact systems have tested billions of parts throughout the world and remain the number one source for testing small signal and power semiconductor components.
Download the 7BT Catalog in PDF Format
Request Pricing, Quotes and Additional Information
Trade in or Sell Your Semiconductor Equipment or List Wanted Equipment
Lorlin Test Systems® 508-879-1827 sales@lorlin.com
Lorlin Test Systems® manufactures and distributes semiconductor component test systems. Through years of dedicated engineering excellence, proven designs, and achievements, Lorlin is proud to maintain the leading cutting edge technology offered in our products. Lorlin's dynamic and encompassing solutions are tailored to customers specific needs and requirements for virtually any test application.
Proven superior and advanced analog and digital electronics engineering designs for over 40 years utilizing advanced circuitry and technology is why Lorlin products are so desired by engineers. Our visions of the research and development needed to meet the demands of today were realized years ago.
Smooth, flawless and flowing engineering design excellence have yielded success, complete customer satisfaction and overwhelming confidence in Lorlins equipment performance. Our test concepts have been developed in an environment of creative flux and intuition with achievements unsurpassed.
Our flexibility and creativity enable us to fulfill your application desires and targeted test and manufacturing goals while staying within your budget. The parametric testing equipment is used to test, evaluate and analyze the electrical characteristics of semiconductor devices in component testing and semiconductor manufacturing applications such as production and final test, wafer probe and wafer mapping, QC & QA test, incoming inspection, engineering evaluation and characterization, high reliability, and high volume testing.
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