Lorlin Test Systems
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Lorlin Test Systems |
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7BT Discrete Semiconductor Tester |
Discrete Testers
      
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Transistors, Diodes, FETs, Jfets, Zeners, IGBTs, MCTs, SCRs, Triacs, Optos, Hybrids, Arrays Parametric Testing of Leakage Current, Breakdown Voltage, Gain, AC, On-State Tests, Off-State Tests, Saturation Voltage, Impedance, Transconductance, Capacitance, and More The Impact 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results. 
A variety of test stations can accommodate almost any application including incoming inspection, final test, wafer probe, quality control, and component characterization. The tester is controlled by a Pentium PC and operates under Windows 98 with Lorlin's PC Application Software.
Lorlin Test Systems® 508-879-1827 mailto:sales@lorlin.com
Power Semiconductor Testers for Manual Applications 2000 Volts, 200 Amps Power Semiconductor Testers for Manual Applications 4000 Volts, 2000 Amps Semiconductor Handlers for ICs, SMDs, SOT, Discretes, Axial and Radial Devices Semiconductor Testers for High Reliability, Quality Control, Incoming Inspection Applications Thermal Resistance Testers for Measurement of Delta VBE of Power Semiconductors Used and Demo Semiconductor Component Handlers and Testers Catalogs, Pricing and Information Requests for Semiconductor Testers and Handlers Copyright © 2008 Lorlin Test Systems |
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