Lorlin Test Systems
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DTS Semiconductor Tester

 
     Discrete Testers

 

Small Signal and Power Discrete Semiconductor Tester

Parametric Measurements of Leakage Current, Breakdown Voltage, Gain, Saturation Voltage, On-State, Off-State, AC , Impedance, Transconductance, Capacitance

Transistors, Diodes, IGBTs, Hybrids, FETs, Jfets, Zeners, IGBTs, SCRs, Triacs, Optos

  • 1200 Volts Standard, Options to 2000 Volts

  • 30 Amps Standard. Options to 200 Amps

  • 1 to 3 Test Stations

  • Manual or Handler and Prober Interfaces

  • Powerful PC Applications Software Package

  • High Rel and Statistical Analysis Software

  • Export Data to Excel

  • Hybrid and Array Stations

  • Easy to Use Windows Software

  • 5 Picoamp Leakage Current Resolution Standard

  • Fast, Reliable, Repeatable and Accurate

  • Low Price

 

 

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Lorlin Test Systems®                                         

Tel: 508-879-1827     Email: sales@lorlin.com

DTS Semiconductor Tester

Power Semiconductor Testers for Manual Applications 4000 Volts, 2000 Amps

Semiconductor Handlers for ICs, SMDs, SOT, Discretes, Axial and Radial Devices

Semiconductor Testers for Discrete Components - Automated PC Based Tester

Semiconductor Testers for High Reliablity, Quality Control, Incoming Inspection Applications

Thermal Resistance Testers for Measurement of Delta VBE of Power Semiconductors

Used and Demo Semiconductor Component Handlers and Testers

Catalogs, Pricing and Information Requests for Semiconductor Testers and Handlers

 

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