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Small Signal and Power Discrete Semiconductor Tester
Parametric Measurements of Leakage Current, Breakdown Voltage, Gain, Saturation Voltage, On-State, Off-State, AC , Impedance, Transconductance, Capacitance
Transistors, Diodes, IGBTs, Hybrids, FETs, Jfets, Zeners, IGBTs, SCRs, Triacs, Optos
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1200 Volts Standard, Options to 2000 Volts |
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30 Amps Standard. Options to 200 Amps |
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1 to 3 Test Stations |
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Manual or Handler and Prober Interfaces |
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Powerful PC Applications Software Package |
| High Rel and Statistical Analysis Software |
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Export Data to Excel |
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Hybrid and Array Stations |
| Easy to Use Windows Software |
| 5 Picoamp Leakage Current Resolution Standard |
| Fast, Reliable, Repeatable and Accurate |
| Low Price |
Lorlin Test Systems®
Tel: 508-879-1827 Email: sales@lorlin.com
Power Semiconductor Testers for Manual Applications 4000 Volts, 2000 Amps
Semiconductor Handlers for ICs, SMDs, SOT, Discretes, Axial and Radial Devices
Semiconductor Testers for Discrete Components - Automated PC Based Tester
Semiconductor Testers for High Reliablity, Quality Control, Incoming Inspection Applications
Thermal Resistance Testers for Measurement of Delta VBE of Power Semiconductors
Used and Demo Semiconductor Component Handlers and Testers
Catalogs, Pricing and Information Requests for Semiconductor Testers and Handlers
Copyright © 2006 Lorlin Test Systems, Inc.